FEI Company FEI is the world leader in the production and distribution of electron microscopes, including scanning electron microscopes (SEM), transmission electron microscopes (TEM), DualBeam™ instruments, and focused ion beam...
X-ray microanalysis on the scanning electron microscope (SEM) is accomplished using either Energy Dispersive Spectrometry (EDS) or Wavelength Dispersive Spectroscopy (WDS). EDS developed in the early 1970's is a exible elemental analysis method used for qualitative and quantitative composition determinations of solid, liquid, thin lm and powder samples. The overlap of analyte peaks in complex EDS ...
It is estimated that ESD (Electro Static Discharge) damage costs American industry approximately $5 billion each year. The cost of ESD damage is not simply manufacturing costs of the components but also component replacement costs, customer service and field service time not to mention the customer's perception of quality. ESD damage may not be immediately measurable as the greatest percentage of ...
Electronic versions of secure documents have evolved gradually over time to supplant their conventional counterparts. Be they passports, national ID cards, driver licenses or healthcare cards, these documents are now equipped with an electronic component embedded within the card or—as in the case of passports—with in the cover or plastic data page. Today, over 50 countries issue electronic ...
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